Inductance Measurements for Multi-Terminal Devices
Written By: Ben Smith
Abstract: DOWNLOAD TECHNICAL PAPER
New innovations in both the telecommunication industry as well as the computer industry have mandated a need for using low inductance capacitive devices in power supply decoupling applications. With this being the case, different concepts for the construction of these devices have recently been the key to the success of reaching inductances of less than 50pH. There is, however, a significant bottleneck to the new innovation process due to measurement techniques. Most of the newer devices are using techniques such as multi-path current flow, short length, and equal and opposite current injection techniques to achieve low inductance levels. Also, coupled with these new designs is the need for higher energy storage capabilities and thus more capacitance. All of these effects are presenting more complex tasks in the measurement process. This paper gives both a generic approach for measurement as well as an exact approach specifically for the Interdigitated (IDC) type devices.