Functional Testing of Decoupling Capacitors For Dynamic RAMs

Functional Testing of Decoupling Capacitors For Dynamic RAMs
Written By: Arch Martin | Ward Parkinson

Abstract:
Comparative performance of various types of distributed decoupling capacitors both with and without bulk tantalum capacitors is shown under actual operating conditions in a 64K dynamic RAM memory board designed especially for high-frequency in-use testing. Multilayer ceramic capacitors are shown to be effective and economical even without using bulk tantalum capacitors for decoupling.
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