Cracks: The Hidden Defect

Cracks: The Hidden Defect
Written By: John Maxwell

Abstract:
Cracks in ceramic chip capacitors can be introduced at any process step during surface mount assembly. Thermal shock has become a “pat” answer for all of these cracks, but about 75 to 80% originate from other sources. These sources include pick and place machine centering jaws, vacuum pick up bit, board depanelization, unwarping boards after soldering, test fixtures, connector insulation, final assembly, as well as defective components. Each source has a unique signature in the type of crack that it develops so that each can be identified as the source of error.
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