Analysis of Solid Tantalum Capacitor Leakage Current
Written By: R. W. Franklin
Abstract: DOWNLOAD TECHNICAL PAPER
The leakage current of a solid tantalum capacitor is the sum of several independent factors. From measurements of leakage over a range of test conditions some degree of separation of these components of the current can be achieved and so the relative importance of factors leading to high leakage can be assessed. There is a background level present directly related to dielectric absorption and it contributes to the loss factor of the capacitor. It is not a true leakage. On top of this absorption current there are other components, most of which are essentially by-passing the bulk of the dielectric. These can be moisture or manganese dioxide tracks or breakdown sites in the dielectric layer. These typical behavior patterns are described in detail.